Multiple scale characterisation of ultrasmall nanocrystals by X-ray Total Scattering

Autori

  • Antonella Guagliardi CNR - Istituto di Cristallografia

DOI:

https://doi.org/10.30441/smartelab.v16i.173

Abstract

oral communication at 1 st Conference on Crystallography, Structural Chemistry and Biosystems, (Catania)

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Pubblicato

2021-10-01

Come citare

Guagliardi, A. (2021). Multiple scale characterisation of ultrasmall nanocrystals by X-ray Total Scattering . SMART ELAB, 16, 16. https://doi.org/10.30441/smartelab.v16i.173

Fascicolo

V. 16 (2021)

Sezione

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