Multiple scale characterisation of ultrasmall nanocrystals by X-ray Total Scattering

Authors

  • Antonella Guagliardi CNR - Istituto di Cristallografia

DOI:

https://doi.org/10.30441/smartelab.v16i.173

Abstract

oral communication at 1 st Conference on Crystallography, Structural Chemistry and Biosystems, (Catania)

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Published

2021-10-01

How to Cite

Guagliardi, A. (2021). Multiple scale characterisation of ultrasmall nanocrystals by X-ray Total Scattering . SMART ELAB, 16, 16. https://doi.org/10.30441/smartelab.v16i.173

Issue

Vol. 16 (2021)

Section

Events and Conferences
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